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The OpenDMIS ® Dual Database

 


The Dual database area contains two tabbed panels which provide simultaneous access to two different sets of data.

Full drag and drop is supported between database tabs and from the database throughout the OpenDMIS environment making working with your data fast and intuitive.

 


Dual Database Features Tab Dual Database Coordinate Systems Tab Dual Database Sensors Tab Dual Database Tolerance Tab Dual Database Variables Tab Dual Database DMIS Program Tab Dual Database Custom Views Tab Dual Database Scan Methods Tab Dual Database SPC Tab

Any one of the following nine data views are available by simply clicking on the tab at the top of one of the database panels.


 

The Features tab of the Dual Database will automatically store all measured and constructed features including multiple CAD models.
The features are intuitively organized by feature type in a tree. Using features from the feature database is a simple as dragging the feature and dropping on the desired location.

Do you need to create a tolerance? Drag the feature from the Feature database and drop in the desired location when creating a tolerance.
Do you need to output a feature? Drag the feature from the feature database and drop it on the Output View.
If you want to add a feature nominal definition to a part program, simply drag the feature from the feature database and drop it on the DMIS program tab.

Additional click context menus provide fast and easy context specific tools for the selected feature(s).
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The Coordinate Systems tab of the Dual Database stores all created coordinate systems, datum labels and coordinate system iteration values.
A coordinate system can be quickly and easily activated by dragging the coordinate system from the Coordinate System Database and dropping on the graphics area.
Coordinate systems can be saved to the hard drive by simply through a right click on the coordinate system label.
Opening saved systems is just as easy.
Quick and simple coordinate systems can be created through drag and drop:
To create a primary level datum, simply drag a planar feature from the feature database and drop onto the coordinate systems tab. To create a secondary alignment, simply drag and line reducible feature from the feature database and drop onto the coordinate systems tab.
An origin can also be created though simple drag and drop.
Obviously far more powerful coordinate system options such as iteritive alignments, multi-point best fit etc are available in the Coordinate System s Operations panel.
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The Sensors tab of the Dual Database provides easy access to all sensor information in an easy to manage tree view
Multiple calibration artifacts of both qualification spheres and ring gages can be stored and accessed through simple Drag and Drop
Sensor qualification is now as easy as dragging the sensors onto the calibration artifact.


...Drag,
          Drop,
               Calibrate...

Each created sensor, sensor position and all sensor calibration data is automatically saved to the hard drive.
All created sensors are available to all measurements solutions. This makes your sensors appear to be a part of the software, eliminating typical sensor management tasks.
Sensor selection is a simple as Drag and Drop. Drag the desired sensor from the sensor database tab and drop it on the graphics area. The sensor will be selected.
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The Tolerance tab of the Dual Database store all created tolerances in an easy to navigate tree view.
A tolerance can be quickly sent to a report by dragging the desired tolerance from the Tolerance tab of the Dual Database and dropping onto the report view.
Once a tolerance has been created, that tolerance can be re-used again and again. Simply drag and different feature and drop it onto the tolerance!
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The Variables tab of the Dual Database provides a quick and easy interface to access some of the High Level Language capabilities of the DMIS language without writing code!
High Level Language variables can be created through Drag and Drop or following simple prompts.

If you need to obtain a value of any previously measured or created entities, simply drop the entity on the Variables tab.
The variable declarations and assignments are all automatically created for you and added to your DMIS program.

Right click context menus present a series of type specific options to make High Level Language quick and easy.

Both internal and external macros can be created and accessed through the Variables Database tab. Macros can be added to your DMIS program through simple Drag and Drop.
Object Oriented programming for the CMM with simple drag and drop!
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The DMIS Program tab of the Dual Database provides a simple interface to execute DMIS programs as well as extensive debugging tools and program generation tools.
From the Program toolbar at the top of the DMIS Program tab, DMIS programs can be loaded and run as well as line by line debugging. Breakpoints can easily be inserted to stop your program at a particular location.
Multiple Book Marks can be added and navigated to make navigating large DMIS programs much quicker and easier.

Programming tools are readily available to make common programming tasks quick and easy.

Programming can be as simple as Drag and Drop.
Simply drag and drop an item on the DMIS Program tab to automatically add the required code to the program.
Numerous items can be dropped onto a program including, feature definitions, feature measurement sequences, tolerance definitions, outputs, coordinate system selections, sensor selections, variables...just to cover a few.

...Drag,
          Drop,
               Program...

Should you wish to perform advanced editing functions, simply send the program to the DMIS editor .
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The Custom Graphics Views tab of the Dual Database provides access to saved custom graphical views as well as graphical reports and form error reports.
A view can be recalled by simply dragging from the Custom Graphics view tab and dropping on the Graphics view, Graphics report view or the Form Error View.
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The Scan Methods tab of the Dual Database provides access to previously defined scan paths. The scan paths are presented in a tree view divided by scan type
Details of a specific scan type are easy edited by double clicking on the scan type. The scan property pane will appear providing easy access to all scan parameters.

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The SPC tab of the Dual Database provides access to optional SPC tools.

A new SPC report can be created through simple Drag and Drop. Both measured features and tolerances can be analyzed in the SPC tools.  Drag the desired item to the SPC tab and select the desired parameters.
Drag and Drop Statistics without having to start up a separate application!

Collected data can easily viewed by double clicking on the desired SPC item.
A property page becomes available containing SPC information including access to individual samples.


Creating a Graphical SPC report is as simple as drag and drop. Drag the desired SPC items from the SPC tab and drop them on the Graphics Report View.

Drag and Drop SPC reporting!

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